Download e-book for kindle: Applications of Finite Element Methods for Reliability by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou

By Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou

ISBN-10: 0857293095

ISBN-13: 9780857293091

Applications of Finite aspect equipment for Reliability reports on ULSI Interconnections offers a close description of the applying of finite point tools (FEMs) to the research of ULSI interconnect reliability. during the last twenty years the applying of FEMs has turn into common and maintains to guide to a more robust figuring out of reliability physics.

To aid readers take care of the expanding sophistication of FEMs’ functions to interconnect reliability, Applications of Finite aspect tools for Reliability reports on ULSI Interconnections will:

  • introduce the main of FEMs;
  • review numerical modeling of ULSI interconnect reliability;
  • describe the actual mechanism of ULSI interconnect reliability encountered within the electronics undefined; and
  • discuss intimately using FEMs to appreciate and enhance ULSI interconnect reliability from either the actual and sensible point of view, incorporating the Monte Carlo method.

A full-scale overview of the numerical modeling method utilized in the examine of interconnect reliability highlights valuable and remarkable options which have been constructed lately. Many illustrations are used through the ebook to enhance the reader’s knowing of the technique and its verification. real experimental effects and micrographs on ULSI interconnects also are included.

Applications of Finite aspect tools for Reliability stories on ULSI Interconnections is an effective reference for researchers who're engaged on interconnect reliability modeling, in addition to in the event you need to know extra approximately FEMs for reliability functions. It offers readers an intensive figuring out of the purposes of FEM to reliability modeling and an appreciation of the strengths and weaknesses of assorted numerical types for interconnect reliability.

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Additional info for Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Example text

J Appl Phys 73:3790–3799 73. Zhai CJ, Blish RC (2005) A physically based lifetime model for stress-induced voiding in interconnects. J Appl Phys 97:113503 74. Fischer AH, Zitzelsberger AE (2001) The quantitative assessment of stress-induced voiding in process qualification. In: Proceedings of 39th IEEE/IRPS conference, Orlando, Florida, IEEE, New York, pp 334–340 75. Tan CM, Hou Y (2007) Lifetime modeling for stress-induced voiding in integrated circuit interconnections. Appl Phys Lett 91:061904 76.

3:10Þ The matrix [K] is called the stiffness matrix. , the truss element) are illustrated. The displacement {d} is the DOF, which is an independent parameter of response from the load {F}. Further examples can be found in the book by Moaveni [17]. This approach is easy to understand when using the FEM for the first time. Basically this approach is applicable to relatively simple problems. ’’ Finite element formulation can be derived using this variational formulation as long as there exists a variational principle corresponding to the problem of interest.

Was established in 1970. ANSYS is an engineering simulation software provider, that develops general purpose finite element analysis and computational fluid dynamics software. In 1971, ANSYS FEM software was released for the first time ABAQUS, Inc. was established in 1978. ABAQUS is a commercial software package for finite element analysis developed by SIMULIA 1980–1990 The application of FEM was extended to other engineering fields, such as the electromagnetic and fluid dynamics problems. As an example, a book entitled ‘‘Finite Elements for Electrical Engineers’’ was published by Silvester and Ferrari in 1983 1990–2010 More books on FEM application in electrical engineering fields were published.

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou

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