Advances in X-Ray Analysis: Volume 30 - download pdf or read online

By Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)

ISBN-10: 1461290759

ISBN-13: 9781461290759

ISBN-10: 1461319358

ISBN-13: 9781461319351

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Extra resources for Advances in X-Ray Analysis: Volume 30

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Now the advent of high intensity x-ray sources such as the synchrotron are opening up new areas of investigation. Who knows what further enhancements are Just around the corner? PERSONAL OBSERVATIONS ON TRENDS IN XRF John V. C. 20375-5000 Over the past many years, x-ray fluorescence analysis (XRF) has developed into a very mature field. The Plenary Session at this, the 35th Annual Denver Conference on Applications of X-Ray Analysis, deals with an evaluation of developments around the world, as viewed by experts from the three major areas, North America, Europe and the Far East.

The development of the Si(Li) detector diode at the turn of the decade gave new life to the what was then called 'nondispersive' analytical method. The ability to dynamically display spectra in a matter of minutes came as a rude awakening to the rather complacent wavelength dispersive (WDS) spectroscopist who were for the most part, happy, pleaaed and content to perform a qualitative analysis in a couple of hours, after all there was, at that time, little or no competition. For a while, the superior sensitivity of the WDS system gave unsurpaasable competition, but the introduction of the secondary target EDS system in 1973, greatly enhanced the rather poor sensitivities exhibited by most contemporary EDS systems.

XRF TECHNIQUIES AND INSTRUMENTATION ACKNOWLEDGEMENTS The author wishes to thank F. Greulich of Sandia, Livermore for providing SEM analysis, Professor J. Drexler of the University of Colorado for providing electron microprobe phase analysis of the ore deposit specimen, B. C. W. Ryon, LLNL, and B. Cross and D. Wherry of Kevex Corporation for constructive discussion regarding this research. REFERENCES 1. C. W. Ryon, An X-ray Microfluorescence Analysis System With Diffraction Capabilities: "Advances In X-ray Analysis" Charles S.

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Advances in X-Ray Analysis: Volume 30 by Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)


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